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The Mediating Effects of Student Satisfaction on Technostress and Performance Expectancy

Table 1: Average variance extracted (AVE) and composite reliability (CR) of confirmatory factor analysis

Construct Items Construct Reliability(CR ≥ 0.6) The average variance extracted(AVE ≥ 0.5)
Techno-Overload 6 0.929 0.685
Techno-Complexity 5 0.936 0.744
Techno-Insecurity 3 0.908 0.767
Techno-Uncertainty 3 0.899 0.749
Technostress 4 0.825 0.553
Student Satisfaction 8 0.964 0.770
Performance Expectancy 6 0.954 0.776
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